| Title: |
Design of Optoelectronic Generators for Mesoband Conducted Effects Testing. |
| Authors: |
Reineix, Gwenael; Hyvernaud, Jeremy; Negrier, Romain; Andrieu, Joel; Lalande, Michele; Couderc, Vincent |
| Source: |
IEEE Transactions on Electromagnetic Compatibility; Oct2020, Vol. 62 Issue 5, p1807-1812, 6p |
| Subject Terms: |
Electromagnetic testing; Power semiconductor switches; Semiconductor switches; Quality factor; Laser pulses; Optoelectronics |
| Abstract: |
In this article, a damped sinusoids high-voltage source based on the optoelectronic waveform generators principle is presented to perform electromagnetic susceptibility testing. Photoconductive semiconductor switches (PCSS), operating in linear switching mode and triggered via a laser pulse, have been used. The developed conducted source generates damped sinusoids with a center frequency between 30 and 600 MHz, a maximum peak-to-peak amplitude of approximately 3 kV for a bias voltage of 4 kV, a Q factor between 8 and 11, and a transient shape closest to a reference damped sinusoid. The dimensions of the source go from 220 mm × 80 mm to 220 mm × 510 mm. A PCSS characterization has been set up to determine the necessary parameters for the establishment of a damped sinusoids optoelectronic generator model on Keysight Advanced Design System software. Experimental tests have been realized using a measurement bench to compare the obtained and simulated signals. [ABSTRACT FROM AUTHOR] |
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| Database: |
Complementary Index |