Nanoscale Infrared and Microwave Imaging of Stacking Faults in Multilayer Graphene.
| Title: | Nanoscale Infrared and Microwave Imaging of Stacking Faults in Multilayer Graphene. |
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| Authors: | Holleis L; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Cohen L; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Samuelson N; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Patterson CL; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Choi Y; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Valentini M; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Sheekey O; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Choi Y; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Zhou J; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Stoyanov H; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States.; Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.; Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.; Hu Q; Bruker Nano Surfaces, Santa Barbara, California 93117, United States.; Kim JH; Bruker Nano Surfaces, Santa Barbara, California 93117, United States.; Phillips C; Bruker Nano Surfaces, Santa Barbara, California 93117, United States.; De Wolf P; Bruker Nano Surfaces, Santa Barbara, California 93117, United States.; Young AF; Department of Physics, University of California at Santa Barbara, Santa Barbara, California 93106, United States. |
| Source: | Nano letters [Nano Lett] 2025 Aug 20; Vol. 25 (33), pp. 12487-12494. Date of Electronic Publication: 2025 Aug 08. |
| Publication Type: | Journal Article |
| Language: | English |
| Journal Info: | Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: MEDLINE; PubMed not MEDLINE |
| Imprint Name(s): | Original Publication: Washington, DC : American Chemical Society, c2001- |
| Abstract: | Graphite exhibits a range of metastable stacking orders, with the number of possible configurations increasing exponentially with the number of layers. Most experimental studies have focused on Bernal and rhombohedral stacking due to the difficulty of identifying and isolating intermediate stacking orders. Motivated by this challenge, we present two atomic force microscopy (AFM) techniques that unambiguously distinguish stacking orders and defects in graphite flakes. Photothermal infrared AFM provides absolute contrast through IR spectral analysis across multiple wavelengths, while scanning microwave impedance microscopy reveals relative contrast among Bernal, intermediate, and rhombohedral domains. We demonstrate that both techniques provide high-contrast identification of stacking orders, are compatible with subsurface imaging through a hexagonal boron nitride dielectric layer, and can resolve nanoscale domain walls. These results pave the way for reliable fabrication of multilayer graphene devices with a well-defined interlayer registry. |
| Contributed Indexing: | Keywords: AFM-IR; atomic force microscopy; domain walls; graphene; rhombohedral; sMIM |
| Entry Date(s): | Date Created: 20250808 Latest Revision: 20250820 |
| Update Code: | 20260130 |
| DOI: | 10.1021/acs.nanolett.5c02301 |
| PMID: | 40779695 |
| Database: | MEDLINE |
Journal Article