Electrically tunable benchtop microscope integrating TIE-based phase imaging and edge AI analysis
| Title: | Electrically tunable benchtop microscope integrating TIE-based phase imaging and edge AI analysis |
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| Authors: | Tsai, Hsieh-Fu ⁎, 1, a, b; Podder, Soumyajit 1, a, c; Chang, I-Ming a; Ho, Mao-Chang a |
| Source: | In Optics and Lasers in Engineering June 2026 201 |
| Database: | ScienceDirect |