| Title: |
Study of Electrical and X-ray induced degradation in BiCMOS 55-nm SiGe:C Heterojunction Bipolar Transistors |
| Authors: |
Bouhouche, Menel; Adebabay Belie, Ayenew; Mansouri, Yasser; Sagnes, Bruno; Boch, Jérôme; Maraine, Tadec; Hoffmann, Alain; Lakhdarac, Maya; Chevalier, Pascal; Gloria, Daniel; Pascal, Fabien |
| Contributors: |
University of Oum El Bouaghi; Institut d’Electronique et des Systèmes (IES); Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM); Micro électronique, Composants, Systèmes, Efficacité Energétique (M@CSEE); Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM); Fiabilité et Systèmes en Environnements Contraints (FSEC); Université de Constantine; Radiations et composants (RADIAC); STMicroelectronics; Université de Bordeaux, ADERA |
| Source: |
ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025 ; https://hal.science/hal-05369208 ; ESREF 2025 : 36th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, 2025, Université de Bordeaux, ADERA, Oct 2025, Bordeaux, France |
| Publisher Information: |
CCSD |
| Publication Year: |
2025 |
| Collection: |
Université de Montpellier: HAL |
| Subject Terms: |
[SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics; [SPI.TRON]Engineering Sciences [physics]/Electronics |
| Subject Geographic: |
Bordeaux; France |
| Description: |
70 ; International audience ; Study of Electrical and X-ray induced degradation in BiCMOS 55-nm SiGe:C Heterojunction Bipolar Transistors |
| Document Type: |
conference object |
| Language: |
French |
| Availability: |
https://hal.science/hal-05369208; https://hal.science/hal-05369208v1/document; https://hal.science/hal-05369208v1/file/F_Pascal_New_Abstract_70_ESREF_2025_IES.pdf |
| Rights: |
info:eu-repo/semantics/OpenAccess |
| Accession Number: |
edsbas.113E7831 |
| Database: |
BASE |