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First demonstration of in-beam performance of bent Monolithic Active Pixel Sensors

Title:	First demonstration of in-beam performance of bent Monolithic Active Pixel Sensors
Authors:	G. Aglieri Rinella; M. Agnello; B. Alessandro; F. Agnese; R. S. Akram; J. Alme; E. Anderssen; D. Andreou; F. Antinori; N. Apadula; P. Atkinson; R. Baccomi; A. Badalà; A. Balbino; C. Bartels; R. Barthel; F. Baruffaldi; I. Belikov; S. Beole; P. Becht; A. Bhatti; M. Bhopal; N. Bianchi; M. B. Blidaru; G. Boca; J. Bok; G. Bonomi; M. Bonora M. Borri; V. Borshchov; E. Botta; G. E. Bruno; M. Buckland; S. Bufalino; M. Cai; P. Camerini; P. Cariola; F. Catalano; C. Ceballos Sanchez; I. Chakaberia; M. Chartier; F. Colamaria; D. Colella; A. Collu; M. Concas; G. Contin; S. Costanza; P. Cui; A. Dainese; J. B. Dainton; L. De Cilladi; C. De Martin; G. De Robertis; W. Deng; A. Di Mauro; Y. Ding; M. Durkac; D. Elia; M. R. Ersdal; M. Faggin; F. Fan; A. Fantoni; P. Fecchio; A. Feliciello; G. Feofilov; A. Ferk; J. Ferencei; G. Fiorenza; A. N. Flores; E. Fragiacomo; D. Gajanana; A. Gal; C. Gao; C. Gargiulo; P. Gianotti; P. Giubilato; A. Grant; L. Greiner; A. Grelli; O. S. Groettvik; F. Grosa; C. Guo Hu; R. Hannigan; J. A. Hasenbichler; H. Helstrup; H. Hillemanns; C. Hills; P. Hindley; B. Hippolyte; B. Hofman; G. H. Hong; G. Huang; J. P. Iddon; H. Ilyas; M. A. Imhoff; A. Isakov; A. Jadlovska; S. Jadlovska; J. Jadlovsky; S. Jaelani; T. Johnson; A. Junique; P. Kalinak; A. Kalweit; M. Keil; Z. Khabanova; H. Khan; B. Kim; C. Kim; J. Kim; T. Kim; J. Klein; A. Kluge; C. Kobdaj; A. Kotliarov; I. Králik; F. Krizek; T. Kugathasan; C. Kuhn; P. G. Kuijer; S. Kushpil; M. J. Kweon; J. Y. Kwon; Y. Kwon; P. La Rocca; A. Lakrathok; R. Langoy; P. Larionov; E. Laudi; T. Lazareva; R. Lea; R. C. Lemmon; X. L. Li; J. Lien; B. Lim; S. H. Lim; S. Lindsay; A. Liu; J. Liu; M. Lunardon; G. Luparello; M. Lupi; M. Mager; A. Maire; Q. W. Malik; G. Mandaglio; V. Manzari; Y. Mao; G. V. Margagliotti; C. Markert; D. Marras; P. Martinengo; S. Masciocchi; M. Masera; A. Masoni; A. Mastroserio; P. F. T. Matuoka; G. Mazza; F. Mazzaschi; M. A. Mazzoni; F Morel; V. Muccifora; A. Mulliri; L. Musa; S. V. Nesbo; D. Nesterov; J. Norman; J. Park; R. N Patra; C. Pastore; H. Pei; X. Peng; S. Piano; C. Pinto; S. Pisano; S. Politano; E. Prakasa; F. Prino; M. Protsenko; M. Puccio; A. Rachevski; L. Ramello; F. Rami; I. Ravasenga; A. Rehman; F. Reidt; F. Riggi; K. Røed; D. Röhrich; F. Ronchetti; A. Rosano; M. J. Rossewij; A. Rossi; R. Rui; R. Russo; R. Sadikin; V. Sarritzu; J. Schambach; S. Senyukov; J. J. Seo; R. Shahoyan; S. Shaukat; S. Siddhanta; M. Sitta; R. J. M. Snellings; W. Snoeys; A. Songmoolnak; J. Sonneveld; F. Soramel; M. Suljic; S. Sumowidagdo; D. Sun; X. Sun; G. J. Tambave; G. Tersimonov; M. Tkacik; M. Toppi; A. Trifiró; S. Trogolo; V. Trubnikov; R. Turrisi; T. S. Tveter; I. Tymchuck; K. Ullaland; M. Urioni; G. L. Usai; N. Valle; L. V. R. van Doremalen; T. Vanat; J. W. Van Hoorne; M. Varga-Kofarago; A. Velure; D. Wang; Y. Wang; J. Wikne; J. R. Wright; R. Xu; P. Yang; Z. Yin; I. -K. Yoo; J. H. Yoon; S. Yuan; V. Zaccolo; E. Zhang; X. Zhang; V. Zherebchevskii; D. Zhou; J. Zhu Y. Zhu; G. Zinovjev; N. Zurlo
Contributors:	Aglieri Rinella, G.; Agnello, M.; Alessandro, B.; Agnese, F.; Akram, R. S.; Alme, J.; Anderssen, E.; Andreou, D.; Antinori, F.; Apadula, N.; Atkinson, P.; Baccomi, R.; Badalà, A.; Balbino, A.; Bartels, C.; Barthel, R.; Baruffaldi, F.; Belikov, I.; Beole, S.; Becht, P.; Bhatti, A.; Bhopal, M.; Bianchi, N.; Blidaru, M. B.; Boca, G.; Bok, J.; Bonomi, G.; Borri, M. Bonora M.; Borshchov, V.; Botta, E.; Bruno, G. E.; Buckland, M.; Bufalino, S.; Cai, M.; Camerini, P.; Cariola, P.; Catalano, F.; Ceballos Sanchez, C.; Chakaberia, I.; Chartier, M.; Colamaria, F.; Colella, D.; Collu, A.; Concas, M.; Contin, G.; Costanza, S.; Cui, P.; Dainese, A.; Dainton, J. B.; De Cilladi, L.; De Martin, C.; De Robertis, G.; Deng, W.; Di Mauro, A.; Ding, Y.; Durkac, M.; Elia, D.; Ersdal, M. R.; Faggin, M.; Fan, F.; Fantoni, A.; Fecchio, P.; Feliciello, A.; Feofilov, G.; Ferk, A.; Ferencei, J.; Fiorenza, G.; Flores, A. N.; Fragiacomo, E.; Gajanana, D.; Gal, A.; Gao, C.; Gargiulo, C.; Gianotti, P.; Giubilato, P.; Grant, A.; Greiner, L.; Grelli, A.; Groettvik, O. S.; Grosa, F.; Guo Hu, C.; Hannigan, R.; Hasenbichler, J. A.; Helstrup, H.; Hillemanns, H.; Hills, C.; Hindley, P.; Hippolyte, B.; Hofman, B.; Hong, G. H.; Huang, G.; Iddon, J. P.; Ilyas, H.; Imhoff, M. A.; Isakov, A.; Jadlovska, A.; Jadlovska, S.; Jadlovsky, J.; Jaelani, S.; Johnson, T.
Publication Year:	2022
Collection:	Università degli studi di Trieste: ArTS (Archivio della ricerca di Trieste)
Subject Terms:	Bent sensor; Monolithic Active Pixel Sensors (MAPS); Solid state detectors
Description:	A novel approach for designing the next generation of vertex detectors foresees to employ wafer-scale sensors that can be bent to truly cylindrical geometries after thinning them to thicknesses of 20–40 μm. To solidify this concept, the feasibility of operating bent MAPS was demonstrated using 1.5cm×3cm ALPIDE chips. Already with their thickness of 50μm, they can be successfully bent to radii of about 2cm without any signs of mechanical or electrical damage. During a subsequent characterisation using a 5.4GeV electron beam, it was further confirmed that they preserve their full electrical functionality as well as particle detection performance. In this article, the bending procedure and the setup used for characterisation are detailed. Furthermore, the analysis of the beam test, including the measurement of the detection efficiency as a function of beam position and local inclination angle, is discussed. The results show that the sensors maintain their excellent performance after bending to radii of 2cm, with detection efficiencies above 99.9% at typical operating conditions, paving the way towards a new class of detectors with unprecedented low material budget and ideal geometrical properties.
Document Type:	article in journal/newspaper
Language:	English
Relation:	info:eu-repo/semantics/altIdentifier/wos/WOS:000911434200002; volume:1028; firstpage:1; lastpage:7; numberofpages:7; journal:NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT; https://hdl.handle.net/11368/3011873; https://www.sciencedirect.com/science/article/pii/S0168900221011098
DOI:	10.1016/j.nima.2021.166280
Availability:	https://hdl.handle.net/11368/3011873; https://doi.org/10.1016/j.nima.2021.166280; https://www.sciencedirect.com/science/article/pii/S0168900221011098
Rights:	info:eu-repo/semantics/openAccess
Accession Number:	edsbas.22DF889A
Database:	BASE