| Title: |
Fast Li-ion storage and dynamics in TiO\(_{2}\) nanoparticle clusters probed by smart scanning electrochemical cell microscopy |
| Authors: |
Tetteh, Emmanuel Batsa (Dr. phil.); Valavanis, Dimitrios (Dr. rer. nat.); Daviddi, Enrico (Dr. rer. nat.); Xu, Xiangdong (Dr. rer. nat.); Santana Santos, Carla (Dr. rer. nat.); Ventosa, Edgar (Prof. Dr.); Martín-Yerga, Daniel (Dr. rer. nat.); Schuhmann, Wolfgang (Prof. Dr. rer nat.); Unwin, Patrick R. (Prof. Dr.) |
| Publication Year: |
2022 |
| Collection: |
Dokumentenrepositorium der RUB / RUB-Repository (Ruhr-Universität Bochum) |
| Subject Terms: |
ddc:540 |
| Description: |
Anatase TiO\(_{2}\) is a promising material for Li-ion (Li\(^{+}\)) batteries with fast charging capability. However, Li\(^{+}\) (de)intercalation dynamics in TiO\(_{2}\) remain elusive and reported diffusivities span many orders of magnitude. Here, we develop a smart protocol for scanning electrochemical cell microscopy (SECCM) with in situ optical microscopy (OM) to enable the high-throughput charge/discharge analysis of single TiO\(_{2}\) nanoparticle clusters. Directly probing active nanoparticles revealed that TiO\(_{2}\) with a size of ≈50 nm can store over 30 % of the theoretical capacity at an extremely fast charge/discharge rate of ≈100 C. This finding of fast Li\(^{+}\) storage in TiO\(_{2}\) particles strengthens its potential for fast-charging batteries. More generally, smart SECCM-OM should find wide applications for high-throughput electrochemical screening of nanostructured materials. |
| Document Type: |
article in journal/newspaper |
| File Description: |
application/pdf |
| Language: |
English |
| Availability: |
https://hss-opus.ub.ruhr-uni-bochum.de/opus4/frontdoor/index/index/docId/11883; https://nbn-resolving.org/urn:nbn:de:hbz:294-118837; https://hss-opus.ub.ruhr-uni-bochum.de/opus4/files/11883/SchuhmannWolfgang.pdf |
| Rights: |
https://creativecommons.org/licenses/by-nc-nd/4.0/ ; info:eu-repo/semantics/openAccess |
| Accession Number: |
edsbas.2484AF77 |
| Database: |
BASE |