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Readout electronics for the LHCb upgrade II muon system

Title: Readout electronics for the LHCb upgrade II muon system
Authors: Congedo, L.; Albicocco, P.; Bencivenni, G.; Ciambrone, P.; Debernardis, F.; De Lucia, E.; De Robertis, G.; De Serio, M.; Felici, G.; Giovannetti, M.; Licciulli, F.; Loddo, F.; Michelis, S.; Morello, G.; Palutan, M.; Pastore, A.; Poli Lener, M.; Ripamonti, G.; Santovetti, E.; Satta, A.; Sciascia, B.; Simone, S.
Source: Journal of Instrumentation ; volume 21, issue 02, page C02033 ; ISSN 1748-0221
Publisher Information: IOP Publishing
Publication Year: 2026
Description: In order to exploit the physics opportunities at the HL-LHC era, the LHCb Collaboration is proposing the upgrade II of the apparatus. The upgraded muon system aims at sustaining expected rates of incident particles up to about 1 MHz/cm 2 , therefore new detectors with high rate capability based on the μ-RWELL technology will be installed in the most exposed inner regions. The baseline option for the readout electronics of the new detectors is based on the FAst Timing Integrated Circuit (FATIC) chip. A first version of this ASIC has been installed on different detector prototypes for the LHCb muon system and tested during a dedicated beam campaign in 2024. Promising results have been obtained, namely a single-gap efficiency above 90% within 25 ns and a time resolution at the level of few ns. In order to guarantee efficient operations at the upgrade II expected rates (∼700 kHz/ch), the FATIC dead time, currently at the level of 1 μs, should be reduced down to 100 ns. A new FATIC version is therefore being developed to fulfil the requirement.
Document Type: article in journal/newspaper
Language: unknown
DOI: 10.1088/1748-0221/21/02/c02033
DOI: 10.1088/1748-0221/21/02/C02033
DOI: 10.1088/1748-0221/21/02/C02033/pdf
Availability: https://doi.org/10.1088/1748-0221/21/02/c02033; https://iopscience.iop.org/article/10.1088/1748-0221/21/02/C02033; https://iopscience.iop.org/article/10.1088/1748-0221/21/02/C02033/pdf
Rights: http://creativecommons.org/licenses/by/4.0/ ; https://iopscience.iop.org/info/page/text-and-data-mining
Accession Number: edsbas.26F2AE50
Database: BASE