| Title: |
Failure analysis of ESD damage on interconnects in LCD GOA |
| Authors: |
Wang, Ye; Fu, Guicui; Tian, Pengcheng; Wan, Bo; Li, Jian; Song, Yong; Yu, Hongjun; Xue, Hailin; Che, Chuncheng; Huang, Dongsheng; Rong, Keyi; Su, Yutai; Chen, Weixiong; Li, Xin |
| Source: |
Engineering Failure Analysis ; volume 131, page 105892 ; ISSN 1350-6307 |
| Publisher Information: |
Elsevier BV |
| Publication Year: |
2022 |
| Collection: |
ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| Document Type: |
article in journal/newspaper |
| Language: |
English |
| DOI: |
10.1016/j.engfailanal.2021.105892 |
| Availability: |
http://dx.doi.org/10.1016/j.engfailanal.2021.105892; https://api.elsevier.com/content/article/PII:S1350630721007536?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S1350630721007536?httpAccept=text/plain |
| Rights: |
https://www.elsevier.com/tdm/userlicense/1.0/ |
| Accession Number: |
edsbas.2BC42EF6 |
| Database: |
BASE |