Analysis of noise in CMOS image sensor based on a unified time-dependent approach
| Title: | Analysis of noise in CMOS image sensor based on a unified time-dependent approach |
|---|---|
| Authors: | Brouk, Igor; Nemirovsky, Amikam; Alameh, Kamal; Nemirovsky, Yael |
| Source: | Solid-State Electronics ; volume 54, issue 1, page 28-36 ; ISSN 0038-1101 |
| Publisher Information: | Elsevier BV |
| Publication Year: | 2010 |
| Collection: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1016/j.sse.2009.09.003 |
| Availability: | https://doi.org/10.1016/j.sse.2009.09.003; https://api.elsevier.com/content/article/PII:S0038110109002470?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:S0038110109002470?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ |
| Accession Number: | edsbas.2E402697 |
| Database: | BASE |