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Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography

Title: Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography
Authors: Defer, M.; Dasgupta, S.; Shahani, A. J.; Xiao, X.; Juul Jensen, D.; Zhang, Y.
Source: Defer , M , Dasgupta , S , Shahani , A J , Xiao , X , Juul Jensen , D & Zhang , Y 2024 , ' Characterization of Si particles in additively manufactured AlSi10Mg using synchrotron transmission X-ray nanotomography ' , IOP Conference Series: Materials Science and Engineering , vol. 1310 , no. 1 , 012027 . https://doi.org/10.1088/1757-899X/1310/1/012027
Publication Year: 2024
Collection: Technical University of Denmark: DTU Orbit / Danmarks Tekniske Universitet
Description: In AlSi10Mg samples manufactured by Laser Powder Bed Fusion, distinguishing the Si eutectic network/Si particles from the Al matrix by X-ray imaging is challenging due to the low absorption contrast between the Al and Si. This work investigates the possibility of overcoming this obstacle in synchrotron transmission X-ray microscopy. Effects of both different defocusing conditions and X-ray beam energies are evaluated and optimal conditions are identified for imaging a sample annealed post-print for 2h at 520°C. It is shown that both large particles (e.g. 4μm) and particles as small as 0.5 μm, can be imaged with reasonable precision in 3D non-destructively.
Document Type: article in journal/newspaper
File Description: application/pdf
Language: English
DOI: 10.1088/1757-899X/1310/1/012027
Availability: https://orbit.dtu.dk/en/publications/2219704f-68f3-42a7-a290-2470794ddf29; https://doi.org/10.1088/1757-899X/1310/1/012027; https://backend.orbit.dtu.dk/ws/files/372047003/Defer_2024_IOP_Conf._Ser._Mater._Sci._Eng._1310_012027.pdf
Rights: info:eu-repo/semantics/openAccess
Accession Number: edsbas.4099273D
Database: BASE