Concurrent In-Situ High-Resolution Electron Backscatter Diffraction and Digital Image Correlation for Full-Field Stress-Strain
| Title: | Concurrent In-Situ High-Resolution Electron Backscatter Diffraction and Digital Image Correlation for Full-Field Stress-Strain |
|---|---|
| Authors: | Gilliland, Will; Ruggles, Tim; Fitzgerald, Kaitlynn; Carroll, Jay; Bomarito, Geoffrey; Hochhalter, Jacob |
| Source: | Microscopy and Microanalysis ; volume 31, issue Supplement_1 ; ISSN 1431-9276 1435-8115 |
| Publisher Information: | Oxford University Press (OUP) |
| Publication Year: | 2025 |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1093/mam/ozaf048.305 |
| Availability: | https://doi.org/10.1093/mam/ozaf048.305; https://academic.oup.com/mam/article-pdf/31/Supplement_1/ozaf048.305/63847346/ozaf048.305.pdf |
| Rights: | https://academic.oup.com/pages/standard-publication-reuse-rights |
| Accession Number: | edsbas.4E305088 |
| Database: | BASE |