| Contributors: |
Holman, Rr; Bethel, Ma; Mentz, Rj; Thompson, Vp; Lokhnygina, Y; Buse, Jb; Chan, Jc; Choi, J; Gustavson, Sm; Iqbal, N; Maggioni, Ap; Marso, Sp; Öhman, P; Pagidipati, Nj; Poulter, N; Ramachandran, A; Zinman, B; Hernandez, Af; EXSCEL Study Group, : Califf RM; Patel, R; George, J; Sourij, H; Wong, Yw; Hannan, K; Sellers, Ma; Gottlieb, P; Lavender, P; Leloudis, D; Meadows, Y; Larson, D; Anderson, H; Elkins, M; Stone, A; Tisch, A; Perkins, L; Sanders, K; Campbell, C; Kennedy, I; Heal, P; Masterson, M; Darbyshire, J; Mumtaz, L; Athwal, R; Ferch, A; Batra, P; Durborow, L; Vincent, J; Woodall, A; Flanagan, T; Katona, B; Reicher, B; Pozzi, E; Oulhaj, A; Coleman, R; Rouleau, Jl; Pocock, Sj; Gorelick, F; Mcmurray, J; Riddle, M; Gagel, R; Collier, T; Markovic, T; Kong, Ap; Hian, Sk; Scott, R; Panelo, A; Yoon, Kh; Sheu, W; Sritara, P; Linong, J; Pan, C; Yong, H; Schernthaner, G; Mathieu, C; Tankova, T; Widimsky, P; Hanefeld, M; Keltai, M; Wainstein, J; del Prato, S; Pirags, V; Jakuboniene, N; Kooy, A; Dziemidok, P; Veresiu, Ia; Dreval, Av; Murin, J; Torello, Al; Sattar, N; Parkhomenko, O; Omar, M; Diaz, R; Lopes, R; Lanas, F; Urina Triana, M; Leiva-Pons, Jl; Aguliera, D; Bergenstal, R; Goodman, S; Yale, Jf |