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Mitigation The Impact of Voltage-Dip on The DFIG Using DVR Based on ANFIS Tool

Title: Mitigation The Impact of Voltage-Dip on The DFIG Using DVR Based on ANFIS Tool
Authors: Amen Alsati, Batol; Issa Ibrahim, Ghassan
Source: Edison Journal for electrical and electronics engineering ; Vol. 3 (2025); 46-64 ; 3007-2611 ; 3007-2603
Publisher Information: Sumerian Scriptum Synthesis Publisher
Publication Year: 2026
Subject Terms: ANFIS; Crowbar; DFIG; Wind
Description: The Doubly Fed Induction Generator (DFIG) performance affected by several states such as the stator voltage variation which has been concentrated by many researchers. When a voltage-dip happens, both stator and rotor currents increase to a high level. Additionally, the DC-link voltage is also increased to a high value. The researchers proposed multiple approaches to mitigate the serious effects that associated with the voltage-dip. Fault-ride through techniques improve the stability of the grid under the voltage-dip and other disturbances that are occurred in the system. In this paper, Dynamic Voltage Restorer (DVR) integrated with adaptive-neuro-fuzzy-inference system (ANFIS) is implemented to enhance the DFIG operation during 50% voltage-dip of the rated value. The proposed scheme is compared with crowbar method. The results are shown that crowbar circuit connection to the DFIG did not mitigate the over-currents. Additionally, the rotor-side converter (RSC) control is lost. The rotor-currents are reduced, and the DC-link voltage ( ) is increased from 1150 V to 1200 V. However, the electromagnetic-torque suffered from ripples. However, the proposed DVR based on (ANFIS) controllers provides the best performance by predicting the voltage-dip occurrence, the rotor-currents are reduced to the normal values comparing with Crowbar method, the ) is also reached to the nominal value (1150 V).
Document Type: article in journal/newspaper
File Description: application/pdf; text/html; application/epub+zip
Language: English
Relation: http://ejeee.sss-publisher.com/index.php/ejeee/article/view/37/87; http://ejeee.sss-publisher.com/index.php/ejeee/article/view/37/88; http://ejeee.sss-publisher.com/index.php/ejeee/article/view/37/89
DOI: 10.62909/ejeee.2025.006
Availability: http://ejeee.sss-publisher.com/index.php/ejeee/article/view/37; https://doi.org/10.62909/ejeee.2025.006
Rights: Copyright (c) 2025 Edison Journal for electrical and electronics engineering ; https://creativecommons.org/licenses/by/4.0
Accession Number: edsbas.57096595
Database: BASE