| Title: |
Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process |
| Authors: |
Phillips, LJ; Rashed, AM; Treharne, RE; Kay, J; Yates, P; Mitrovic, IZ; Weerakkody, A; Hall, S; Durose, K |
| Publisher Information: |
Elsevier BV |
| Publication Year: |
2015 |
| Collection: |
The University of Liverpool Repository |
| Description: |
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic-inorganic hybrid perovskite CH 3 NH 3 PbI 3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500nm. |
| Document Type: |
article in journal/newspaper |
| File Description: |
text |
| Language: |
English |
| ISSN: |
2352-3409 |
| Relation: |
https://livrepository.liverpool.ac.uk/3003797/1/Dispersion%20relation%20data%20for%20methylammonium%20lead%20triiodide%20perovskite%20deposited%20on%20a%20%28100%29%20silicon%20wafer%20using%20a%20two-step%20vapour-phase%20reaction%20process.pdf; Phillips, LJ orcid:0000-0001-5181-1565 , Rashed, AM, Treharne, RE, Kay, J, Yates, P, Mitrovic, IZ orcid:0000-0003-4816-8905 , Weerakkody, A, Hall, S orcid:0000-0001-8387-1036 and Durose, K orcid:0000-0003-1183-3211 (2015) Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process Data in Brief, 5. pp. 926-928. ISSN 2352-3409, 2352-3409 |
| DOI: |
10.1016/j.dib.2015.10.026 |
| Availability: |
https://livrepository.liverpool.ac.uk/3003797/; https://doi.org/10.1016/j.dib.2015.10.026 |
| Accession Number: |
edsbas.5E427FA |
| Database: |
BASE |