Prediction of Induced Voltages on Ports in Complex, Three-Dimensional Enclosures With Apertures, Using the Random Coupling Model
| Title: | Prediction of Induced Voltages on Ports in Complex, Three-Dimensional Enclosures With Apertures, Using the Random Coupling Model |
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| Authors: | Gil Gil, Jesus; Drikas, Zachary B.; Andreadis, Tim D.; Anlage, Steven M. |
| Source: | IEEE Transactions on Electromagnetic Compatibility ; volume 58, issue 5, page 1535-1540 ; ISSN 0018-9375 1558-187X |
| Publisher Information: | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Year: | 2016 |
| Document Type: | article in journal/newspaper |
| Language: | unknown |
| DOI: | 10.1109/temc.2016.2580301 |
| Availability: | https://doi.org/10.1109/temc.2016.2580301; http://xplorestaging.ieee.org/ielx7/15/7544542/07513453.pdf?arnumber=7513453 |
| Rights: | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
| Accession Number: | edsbas.66AC3BAF |
| Database: | BASE |