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Search for low-mass electron-recoil dark matter using a single-charge sensitive SuperCDMS-HVeV detector

Title: Search for low-mass electron-recoil dark matter using a single-charge sensitive SuperCDMS-HVeV detector
Authors: SuperCDMS Collaboration; Albakry, M. F.; Alkhatib, I.; Alonso-González, D.; Anczarski, J.; Aralis, T.; Aramaki, T.; Ataee Langroudy, I.; Bathurst, C.; Bhattacharyya, R.; Biffl, A. J.; Brink, P. L.; Buchanan, M.; Bunker, R.; Cabrera, B.; Calkins, R.; Cameron, R. A.; Cartaro, C.; Cerdeño, D. G.; Chang, Y.-Y.; Chaudhuri, M.; Chen, J.-H.; Chen, R.; Chott, N.; Cooley, J.; Coombes, H.; Cushman, P.; Cyna, R.; Das, S.; Dharani, S.; di Vacri, M. L.; Diamond, M. D.; Elwan, M.; Fallows, S.; Fascione, E.; Figueroa-Feliciano, E.; Franzen, S. L.; Gevorgian, A.; Ghaith, M.; Godden, G.; Golatkar, J.; Golwala, S. R.; Gualtieri, R.; Hall, J.; Harms, S. A. S.; Hays, C.; Hines, B. A.; Hong, Z.; Hsu, L.; Huber, M. E.; Iyer, V.; Kashyap, V. K. S.; Keller, S. T. D.; Kelsey, M. H.; Kennard, K. T.; Kromer, Z.; Kubik, A.; Kurinsky, N. A.; Lee, M.; Leyva, J.; Lichtenberg, B.; Liu, J.; Liu, Y.; Lopez Asamar, E.; Lukens, P.; López Noé, R.; MacFarlane, D. B.; Mahapatra, R.; Mammo, J. S.; Mast, N.; Mayer, A. J.; McNamara, P. C.; Meyer zu Theenhausen, H.; Michaud, É.; Michielin, E.; Mickelson, K.; Mirabolfathi, N.; Mirzakhani, M.; Mohanty, B.; Mondal, D.; Monteiro, D.; Nelson, J.; Neog, H.; Novati, V.; Orrell, J. L.; Osborne, M. D.; Oser, S. M.; Pandey, L.; Pandey, S.; Partridge, R.; Patel, P. K.; Pedreros, D. S.; Peng, W.; Perry, W. L.; Podviianiuk, R.; Potts, M.; Poudel, S. S.; Pradeep, A.; Pyle, M.; Rau, W.; Ren, R.; Reynolds, T.; Rios, M.; Roberts, A.; Robinson, A. E.; Rosado Del Rio, L.; Ryan, J. L.; Saab, T.; Sadek, D.; Sadoulet, B.; Sahoo, S. P.; Saikia, I.; Salehi, S.; Sander, J.; Sandoval, B.; Sattari, A.; Schmidt, B.; Schnee, R. W.; Serfass, B.; Sharbaugh, A. E.; Shenoy, R. S.; Simchony, A.; Sinervo, P.; Smith, Z. J.; Soni, R.; Stifter, K.; Street, J.; Stukel, M.; Sun, H.; Tanner, E.; Tenpas, N.; Toback, D.; Villano, A. N.; Viol, J.; von Krosigk, B.; Wang, Y.; Wen, O.; Williams, Z.; Wilson, M. J.; Winchell, J.; Yellin, S.; Young, B. A.; Zatschler, B.; Zatschler, S.; Zaytsev, A.; Zhang, E.; Zheng, L.; Zuniga, A.; Zurowski, M. J.
Source: Physical Review D, 113 (3), Art.-Nr.: 032001 ; ISSN: 2470-0010, 2470-0029
Publisher Information: American Physical Society
Publication Year: 2026
Collection: KITopen (Karlsruhe Institute of Technologie)
Subject Terms: ddc:530; Physics; info:eu-repo/classification/ddc/530
Description: We present constraints on low-mass dark matter electron scattering and absorption interactions using a SuperCDMS high-voltage eV-resolution (HVeV) detector. Data were taken underground in the NEXUS facility located at Fermilab with an overburden of 225 meters of water equivalent. The experiment benefits from the minimizing of luminescence from the printed circuit boards in the detector holder used in all previous HVeV studies. A blind analysis of 6.1 g·days of exposure produces exclusion limits for dark matter-electron scattering cross sections for masses as low as 1 MeV/𝑐2, as well as on the photon-dark photon mixing parameter and the coupling constant between axionlike particles and electrons for particles with masses >1.2 eV/𝑐2 probed via absorption processes.
Document Type: article in journal/newspaper
File Description: application/pdf
Language: English
ISSN: 2470-0010; 2470-0029
Relation: info:eu-repo/semantics/altIdentifier/wos/001692477800001; info:eu-repo/semantics/altIdentifier/issn/2470-0010; info:eu-repo/semantics/altIdentifier/issn/2470-0029; https://publikationen.bibliothek.kit.edu/1000191152; https://publikationen.bibliothek.kit.edu/1000191152/176166262; https://doi.org/10.5445/IR/1000191152
DOI: 10.5445/IR/1000191152
Availability: https://publikationen.bibliothek.kit.edu/1000191152; https://publikationen.bibliothek.kit.edu/1000191152/176166262; https://doi.org/10.5445/IR/1000191152
Rights: https://creativecommons.org/licenses/by/4.0/deed.de ; info:eu-repo/semantics/openAccess
Accession Number: edsbas.6A3A51CE
Database: BASE