| Title: |
A characterization technique for nanosecond gated CMOS x-ray cameras |
| Authors: |
Dayton, M.; Carpenter, A.; Chen, H.; Palmer, N.; Datte, P.; Bell, P.; Sanchez, M.; Claus, L.; Robertson, G.; Porter, J. |
| Contributors: |
Koch, Jeffrey A.; Grim, Gary P. |
| Source: |
SPIE Proceedings ; Target Diagnostics Physics and Engineering for Inertial Confinement Fusion V ; volume 9966, page 996602 ; ISSN 0277-786X |
| Publisher Information: |
SPIE |
| Publication Year: |
2016 |
| Document Type: |
conference object |
| Language: |
unknown |
| DOI: |
10.1117/12.2237882 |
| Availability: |
https://doi.org/10.1117/12.2237882 |
| Accession Number: |
edsbas.6BB90AAD |
| Database: |
BASE |