Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM)
| Title: | Characterization of Oxide Layers on Stainless Steel Using Auger Electron Spectroscopy (AES), Scanning Electron Microscopy-Focused Ion Beam (SEM-FIB) and Transmission Electron Microscopy (TEM) |
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| Authors: | Ajo, Henry |
| Source: | Microscopy and Microanalysis ; volume 26, issue S2, page 1566-1566 ; ISSN 1431-9276 1435-8115 |
| Publisher Information: | Oxford University Press (OUP) |
| Publication Year: | 2020 |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1017/s1431927620018541 |
| Availability: | https://doi.org/10.1017/s1431927620018541; https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927620018541 |
| Rights: | https://www.cambridge.org/core/terms |
| Accession Number: | edsbas.6E06EEEA |
| Database: | BASE |