Revisiting the amplified spontaneous emission threshold: towards a robust metric for classifying lasing materials
| Title: | Revisiting the amplified spontaneous emission threshold: towards a robust metric for classifying lasing materials |
|---|---|
| Authors: | Merklin, Georg; Jean-Woldemar, Enzo; Hantonne, Isabelle; Jollivet, Arnaud; Forget, Sébastien; Chénais, Sébastien |
| Contributors: | Lee, Tae-Woo; So, Franky; Kim, Ji-Seon |
| Source: | Organic and Hybrid Light Emitting Materials and Devices XXIX ; page 48 |
| Publisher Information: | SPIE |
| Publication Year: | 2025 |
| Document Type: | conference object |
| Language: | unknown |
| DOI: | 10.1117/12.3064404 |
| Availability: | https://doi.org/10.1117/12.3064404 |
| Accession Number: | edsbas.72F356D5 |
| Database: | BASE |