| Title: |
II-VI Semiconductor Heterostructures: Pointers to Appropriate Analysis Techniques |
| Authors: |
Bithell, Erica G. |
| Source: |
MRS Proceedings ; volume 216 ; ISSN 0272-9172 1946-4274 |
| Publisher Information: |
Springer Science and Business Media LLC |
| Publication Year: |
1990 |
| Description: |
Approximate methods are used, for a variety of II–VI semiconductor alloys, to estimate the sensitivity to composition change of quantitative transmission electron microscopy techniques which have proved successful in characterising III–V heterostructures. It is shown that bright field thickness fringe matching at the [001] axis is likely to prove relatively more successful than 200 dark field intensity measurement for many alloy systems. It is also noted that alternative methods would be necessary if quantitative characterisation of (Mn,Zn) compounds were required. |
| Document Type: |
article in journal/newspaper |
| Language: |
English |
| DOI: |
10.1557/proc-216-433 |
| Availability: |
http://dx.doi.org/10.1557/proc-216-433; https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1946427400498702 |
| Rights: |
https://www.cambridge.org/core/terms |
| Accession Number: |
edsbas.745D1CD3 |
| Database: |
BASE |