| Title: |
Focused Ion Beam Nano-thermometry |
| Authors: |
Deitz, Julia I; Ruggles, Timothy J; Rosenberg, Samantha G; Lam, Mila N; Jauregui, Luis; Williard, John; Perry, Daniel L; Boro, Joseph; Hodges, Wyatt |
| Source: |
Microscopy and Microanalysis ; volume 29, issue Supplement_1, page 534-535 ; ISSN 1431-9276 1435-8115 |
| Publisher Information: |
Oxford University Press (OUP) |
| Publication Year: |
2023 |
| Document Type: |
article in journal/newspaper |
| Language: |
English |
| DOI: |
10.1093/micmic/ozad067.251 |
| Availability: |
https://doi.org/10.1093/micmic/ozad067.251; https://academic.oup.com/mam/article-pdf/29/Supplement_1/534/50932074/ozad067.251.pdf |
| Rights: |
https://academic.oup.com/pages/standard-publication-reuse-rights |
| Accession Number: |
edsbas.7465CCAF |
| Database: |
BASE |