| Title: |
Error rates and resource overheads of encoded three-qubit gates |
| Authors: |
Takagi, Ryuji; Yoder, Theodore J.; Chuang, Isaac L.; Yoder, Theodore James; Chuang, Isaac |
| Contributors: |
Massachusetts Institute of Technology. Department of Physics; Takagi, Ryuji; Yoder, Theodore James; Chuang, Isaac |
| Source: |
American Physical Society |
| Publisher Information: |
American Physical Society |
| Publication Year: |
2017 |
| Collection: |
DSpace@MIT (Massachusetts Institute of Technology) |
| Description: |
A non-Clifford gate is required for universal quantum computation, and, typically, this is the most error-prone and resource-intensive logical operation on an error-correcting code. Small, single-qubit rotations are popular choices for this non-Clifford gate, but certain three-qubit gates, such as Toffoli or controlled-controlled-Z (ccz), are equivalent options that are also more suited for implementing some quantum algorithms, for instance, those with coherent classical subroutines. Here, we calculate error rates and resource overheads for implementing logical ccz with pieceable fault tolerance, a nontransversal method for implementing logical gates. We provide a comparison with a nonlocal magic-state scheme on a concatenated code and a local magic-state scheme on the surface code. We find the pieceable fault-tolerance scheme particularly advantaged over magic states on concatenated codes and in certain regimes over magic states on the surface code. Our results suggest that pieceable fault tolerance is a promising candidate for fault tolerance in a near-future quantum computer. |
| Document Type: |
article in journal/newspaper |
| File Description: |
application/pdf |
| Language: |
English |
| Relation: |
http://dx.doi.org/10.1103/PhysRevA.96.042302; Physical Review A; https://hdl.handle.net/1721.1/114466 |
| Availability: |
https://hdl.handle.net/1721.1/114466 |
| Rights: |
Article is made available in accordance with the publisher's policy and may be subject to US copyright law. Please refer to the publisher's site for terms of use. ; American Physical Society |
| Accession Number: |
edsbas.78D88907 |
| Database: |
BASE |