X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids
| Title: | X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids |
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| Authors: | Heighway P. G.; Peake D. J.; Stevens T.; Wark J. S.; Albertazzi B.; Ali S. J.; Antonelli L.; Armstrong M. R.; Baehtz C.; Ball O. B.; Banerjee S.; Belonoshko A. B.; Bolme C. A.; Bouffetier V.; Briggs R.; Buakor K.; Butcher T.; Di Dio Cafiso S.; Cerantola V.; Chantel J.; Di Cicco A.; Coleman A. L.; Collier J.; Collins G.; Comley A. J.; Coppari F.; Cowan T. E.; Cristoforetti G.; Cynn H.; Descamps A.; Dorchies F.; Duff M. J.; Dwivedi A.; Edwards C.; Eggert J. H.; Errandonea D.; Fiquet G.; Galtier E.; Laso Garcia A.; Ginestet H.; Gizzi L.; Gleason A.; Goede S.; Gonzalez J. M.; Gorman M. G.; Harmand M.; Hartley N. J.; Hernandez-Gomez C.; Higginbotham A.; Hoppner H.; Humphries O. S.; Husband R. J.; Hutchinson T. M.; Hwang H.; Keen D. A.; Kim J.; Koester P.; Konopkova Z.; Kraus D.; Krygier A.; Labate L.; Lazicki A. E.; Lee Y.; Liermann H. -P.; Mason P.; Masruri M.; Massani B.; McBride E. E.; McGuire C.; McHardy J. D.; McGonegle D.; McWilliams R. S.; Merkel S.; Morard G.; Nagler B.; Nakatsutsumi M.; Nguyen-Cong K.; Norton A. -M.; Oleynik I. I.; Otzen C.; Ozaki N.; Pandolfi S.; Pelka A.; Pereira K. A.; Phillips J. P.; Prescher C.; Preston T.; Randolph L.; Ranjan D.; Ravasio A.; Rips J.; Santamaria-Perez D.; Savage D. J.; Schoelmerich M.; Schwinkendorf J. -P.; Singh S.; Smith J.; Smith R. F.; Sollier A.; Spear J.; Spindloe C.; Stevenson M.; Strohm C.; Suer T. -A.; Tang M.; Toncian M.; Toncian T.; Tracy S. J.; Trapananti A.; Tschentscher T.; Tyldesley M.; Vennari C. E.; Vinci T.; Vogel S. C.; Volz T. J.; Vorberger J.; Willman J. T.; Wollenweber L.; Zastrau U.; Brambrink E.; Appel K.; McMahon M. I. |
| Contributors: | Heighway, P; Peake, D; Stevens, T; Wark, J; Albertazzi, B; Ali, S; Antonelli, L; Armstrong, M; Baehtz, C; Ball, O; Banerjee, S; Belonoshko, A; Bolme, C; Bouffetier, V; Briggs, R; Buakor, K; Butcher, T; Di Dio Cafiso, S; Cerantola, V; Chantel, J; Di Cicco, A; Coleman, A; Collier, J; Collins, G; Comley, A; Coppari, F; Cowan, T; Cristoforetti, G; Cynn, H; Descamps, A; Dorchies, F; Duff, M; Dwivedi, A; Edwards, C; Eggert, J; Errandonea, D; Fiquet, G; Galtier, E; Laso Garcia, A; Ginestet, H; Gizzi, L; Gleason, A; Goede, S; Gonzalez, J; Gorman, M; Harmand, M; Hartley, N; Hernandez-Gomez, C; Higginbotham, A; Hoppner, H; Humphries, O; Husband, R; Hutchinson, T; Hwang, H; Keen, D; Kim, J; Koester, P; Konopkova, Z; Kraus, D; Krygier, A; Labate, L; Lazicki, A; Lee, Y; Liermann, H; Mason, P; Masruri, M; Massani, B; Mcbride, E; Mcguire, C; Mchardy, J; Mcgonegle, D; Mcwilliams, R; Merkel, S; Morard, G; Nagler, B; Nakatsutsumi, M; Nguyen-Cong, K; Norton, A; Oleynik, I; Otzen, C; Ozaki, N; Pandolfi, S; Pelka, A; Pereira, K; Phillips, J; Prescher, C; Preston, T; Randolph, L; Ranjan, D; Ravasio, A; Rips, J; Santamaria-Perez, D; Savage, D; Schoelmerich, M; Schwinkendorf, J; Singh, S; Smith, J; Smith, R; Sollier, A; Spear, J |
| Publisher Information: | American Institute of Physics; US |
| Publication Year: | 2025 |
| Collection: | Università degli Studi di Milano-Bicocca: BOA (Bicocca Open Archive) |
| Subject Terms: | free electron laser; femtoseconds XRD; thermal diffuse scattering |
| Description: | We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders. |
| Document Type: | article in journal/newspaper |
| File Description: | STAMPA |
| Language: | English |
| Relation: | info:eu-repo/semantics/altIdentifier/wos/WOS:001600353100001; volume:138; issue:15; journal:JOURNAL OF APPLIED PHYSICS; https://hdl.handle.net/10281/595883 |
| DOI: | 10.1063/5.0295250 |
| Availability: | https://hdl.handle.net/10281/595883; https://doi.org/10.1063/5.0295250 |
| Rights: | info:eu-repo/semantics/openAccess ; license:Creative Commons ; license uri:http://creativecommons.org/licenses/by-nc-nd/4.0/ |
| Accession Number: | edsbas.7D1A1B05 |
| Database: | BASE |