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Sensitivity-based optimization of test configurations for parameters identification using full field measurements

Title: Sensitivity-based optimization of test configurations for parameters identification using full field measurements
Authors: Serrurier, Ninon; Bouda, Pascal; Feld-Payet, Sylvia; Fourest, Thomas; Réthoré, Julien
Contributors: Service d'Etudes Mécaniques et Thermiques (SEMT); Département de Modélisation des Systèmes et Structures (DM2S); Institut des Sciences Appliquées et de la Simulation pour les énergies bas carbone (ISAS); CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)); Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-CEA-Direction des Energies (ex-Direction de l'Energie Nucléaire) (CEA-DES (ex-DEN)); Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay-Institut des Sciences Appliquées et de la Simulation pour les énergies bas carbone (ISAS); Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Université Paris-Saclay; CEA- Saclay (CEA); Commissariat à l'énergie atomique et aux énergies alternatives (CEA); DMAS, ONERA, Université Paris Saclay Châtillon; ONERA-Université Paris-Saclay; DMAS, ONERA Lille; ONERA; Institut de Recherche en Génie Civil et Mécanique (GeM); Centre National de la Recherche Scientifique (CNRS)-NANTES UNIVERSITÉ - École Centrale de Nantes (Nantes Univ - ECN); Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ)-Nantes université - UFR des Sciences et des Techniques (Nantes univ - UFR ST); Nantes Université - pôle Sciences et technologie; Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ)-Nantes Université - pôle Sciences et technologie; Nantes Université (Nantes Univ)-Nantes Université - Institut Universitaire de Technologie Saint-Nazaire (Nantes Univ - IUT Saint-Nazaire); Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ)-Nantes Université - Ecole Polytechnique de l'Université de Nantes (Nantes Univ - EPUN); Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ)
Source: 2025 SEM Annual Conference; https://cea.hal.science/cea-05361384; 2025 SEM Annual Conference, Jun 2025, Milwaukee, United States
Publisher Information: CCSD
Publication Year: 2025
Subject Terms: [SPI.MECA.MEMA]Engineering Sciences [physics]/Mechanics [physics.med-ph]/Mechanics of materials [physics.class-ph]
Subject Geographic: Milwaukee; United States
Description: International audience ; In dynamic, the material properties are typically established through the implementation of testing methodologies based on homogeneous stress/strain states. Recent advances in optical technology have enabled the identification of dynamic material parameters through the use of full-field measurement and inverse methods. In this approach, the specimen design is crucial, as it must be sensitive to the various parameters to be identified. Different methodologies have been developed to optimize the geometry of the specimen based on the sensitivity of the material properties [1][2]. The primary limitation of these approaches is the calculation cost that strongly increases with the number of parameters. This cost becomes prohibitive when identifying complex non-linear laws, commonly used in dynamics. This work proposes an innovative method based on the use of surrogate models and high-performance computing to optimize a specimen geometry by its sensitivity to material parameters. In this purpose, a surrogate model based on a parametrized specimen geometry and its mechanical response is built. The configurations are then assessed through their sensitivity level, characterized by the covariance matrix of the displacement sensitivity to material parameters to be identified. Finally, the geometry is modified until the richness is considered sufficient for a robust material parameter identification.
Document Type: conference object
Language: English
Availability: https://cea.hal.science/cea-05361384
Accession Number: edsbas.7D52140A
Database: BASE