Katalog Plus
Bibliothek der Frankfurt UAS
Bald neuer Katalog: sichern Sie sich schon vorab Ihre persönlichen Merklisten im Nutzerkonto: Anleitung.
Dieses Ergebnis aus BASE kann Gästen nicht angezeigt werden.  Login für vollen Zugriff.

UV-assisted nanoimprint lithography: the impact of the loading effect in silicon on nanoscale patterns of metalens

Title: UV-assisted nanoimprint lithography: the impact of the loading effect in silicon on nanoscale patterns of metalens
Authors: Alnakhli, Zahrah; Liu, Zhiyuan; AlQatari, Feras; Cao, Haicheng; Li, Xiaohang
Contributors: Global Collaborative Research, King Abdullah University of Science and Technology; King Abdullah University of Science and Technology
Source: Nanoscale Advances ; volume 6, issue 11, page 2954-2967 ; ISSN 2516-0230
Publisher Information: Royal Society of Chemistry (RSC)
Publication Year: 2024
Description: This work studies the impact of the silicon (Si) loading effect induced by deep reactive ion etching (DRIE) of silicon master molds on the UV-nanoimprint lithography (NIL) patterning of nanofeatures.
Document Type: article in journal/newspaper
Language: English
DOI: 10.1039/d4na00120f
Availability: https://doi.org/10.1039/d4na00120f; http://pubs.rsc.org/en/content/articlepdf/2024/NA/D4NA00120F
Rights: http://creativecommons.org/licenses/by-nc/3.0/
Accession Number: edsbas.7FAD7896
Database: BASE