| Title: |
Stochastic Nonlinear Dynamical Modelling of SRAM Bitcells in Retention Mode |
| Authors: |
Van Brandt, Léopold; Flandre, Denis; Delvenne, Jean-Charles; 2024 8th IEEE Electron Devices Technology &; Manufacturing Conference (EDTM) |
| Contributors: |
UCL - SST/ICTM/INMA - Pôle en ingénierie mathématique |
| Publication Year: |
2024 |
| Collection: |
DIAL@USL-B (Université Saint-Louis, Bruxelles) |
| Description: |
SRAM bitcells in retention mode behave as autonomous stochastic nonlinear dynamical systems. From observation of variability-aware transient noise simulations, we provide an unidimensional model, fully characterizable by conventional deterministic SPICE simulations, insightfully explaining the mechanism of intrinsic noise-induced bit flips. The proposed model is exploited to, first, explain the reported inaccuracy of existing closed-form near-equilibrium formulas aimed at predicting the mean time to failure and, secondly, to propose a closer estimate attractive in terms of CPU time. |
| Document Type: |
conference object |
| Language: |
English |
| Relation: |
boreal:294774; https://hdl.handle.net/2078.1/294774 |
| DOI: |
10.1109/edtm58488.2024.10512067 |
| Availability: |
https://hdl.handle.net/2078.1/294774; https://doi.org/10.1109/edtm58488.2024.10512067 |
| Rights: |
info:eu-repo/semantics/openAccess |
| Accession Number: |
edsbas.802DDB63 |
| Database: |
BASE |