Complex Permittivity and Permeability of Vanadium Dioxide at Microwave Frequencies
| Title: | Complex Permittivity and Permeability of Vanadium Dioxide at Microwave Frequencies |
|---|---|
| Authors: | Benjamin Mapleback; Kelvin Nicholson; Mohammad Taha; Thomas Baum; Kamran Ghorbani |
| Publication Year: | 2019 |
| Subject Terms: | Electrical engineering not elsewhere classified; Dielectric measurement; Mott material; X-band; metal–insulator transition (MIT); switch; thin film; vanadium dioxide (VO2) |
| Description: | Vanadium dioxide (VO2) has been identified as a material capable of transitioning from an insulator to a metal close to room temperature. Previous works have demonstrated potential applications of this material in various microwave components or devices. However, the complex permittivity and permeability characterization of the VO2 over X-band has not been previously reported. Knowledge of these properties is essential for accurate modeling of the components and devices utilizing VO2. This paper characterizes a VO2 film deposited on a quartz substrate in a WR90 waveguide using a vector network analyzer. The S-parameters, conductivity, relative complex permittivity, and permeability of the VO2 film are determined across the transition temperature. |
| Document Type: | article in journal/newspaper |
| Language: | unknown |
| Relation: | 10779/rmit.27489660.v1; https://figshare.com/articles/journal_contribution/Complex_Permittivity_and_Permeability_of_Vanadium_Dioxide_at_Microwave_Frequencies/27489660 |
| Availability: | https://figshare.com/articles/journal_contribution/Complex_Permittivity_and_Permeability_of_Vanadium_Dioxide_at_Microwave_Frequencies/27489660 |
| Rights: | All rights reserved |
| Accession Number: | edsbas.8C58E525 |
| Database: | BASE |