| Title: |
A Combined In-situ and Electron Tomography Holder for (S)TEM |
| Authors: |
Mitterbauer, C; Browning, ND; Deshmukh, Pushkarraj V |
| Source: |
Microscopy Today ; volume 15, issue 1, page 34-35 ; ISSN 2150-3583 1551-9295 |
| Publisher Information: |
Oxford University Press (OUP) |
| Publication Year: |
2007 |
| Description: |
Recent advances in in-situ and tomographic methods using (scanning) transmission electron microscopy ((S)TEM) provide the unique possibility of obtaining 3-dimensional (3D) information and in-situ studies of gas-solid chemical reactions on the nanometer scale. In combination with the well-known analytical techniques, electron energy-loss spectroscopy (EELS) and energy dispersive X-ray spectroscopy (EDXS) we can obtain 3D, dynamic, analytical, and structural information down to the atomic level. The JEOL JEM-2500SE STEM/TEM at UC Davis (CHMS) is equipped with a Schottky field-emission source operated at 200 kV, a post column Gatan imaging filter (863 GIF Tridiem) for EELS and a Thermo System Six for EDXS. |
| Document Type: |
article in journal/newspaper |
| Language: |
English |
| DOI: |
10.1017/s1551929500051178 |
| Availability: |
https://doi.org/10.1017/s1551929500051178; https://academic.oup.com/mt/article-pdf/15/1/34/48513643/mt0034.pdf |
| Rights: |
https://academic.oup.com/journals/pages/open_access/funder_policies/chorus/standard_publication_model |
| Accession Number: |
edsbas.972EDF4E |
| Database: |
BASE |