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Nanoscale compositional analysis of wurtzite BAlN thin film using atom probe tomography

Title: Nanoscale compositional analysis of wurtzite BAlN thin film using atom probe tomography
Authors: Sarker, Jith; Tran, Tinh Binh; AlQatari, Feras; Liao, Che-Hao; Li, Xiaohang; Mazumder, Baishakhi
Contributors: Competitive Research Grants; GCC Research Council; King Abdullah University of Science and Technology
Source: Applied Physics Letters ; volume 117, issue 23 ; ISSN 0003-6951 1077-3118
Publisher Information: AIP Publishing
Publication Year: 2020
Description: In this work, the local atomic level composition of BAlN films with ∼20% B was investigated using atom probe tomography. Dislocations and elemental clustering were confirmed along which Al atoms tend to segregate. The presence of local compositional heterogeneities (dislocations and small clusters) and impurities is related to the variation of local alloy stoichiometry of the BAlN films. The roughness and interface abruptness of BAlN/AlN were investigated, and a few nm of B and Al composition gradient in BAlN adjacent to the interface was observed. The nanoscale compositional analysis reported here will be crucial for developing BAlN films with a high B content and larger thickness for future high power electronics and optical applications.
Document Type: article in journal/newspaper
Language: English
DOI: 10.1063/5.0027861
DOI: 10.1063/5.0027861/14541500/232103_1_online.pdf
Availability: https://doi.org/10.1063/5.0027861; https://pubs.aip.org/aip/apl/article-pdf/doi/10.1063/5.0027861/14541500/232103_1_online.pdf
Accession Number: edsbas.AE171101
Database: BASE