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An Algorithm of an X-ray Hit Allocation to a Single Pixel in a Cluster and Its Test-Circuit Implementation

Title: An Algorithm of an X-ray Hit Allocation to a Single Pixel in a Cluster and Its Test-Circuit Implementation
Authors: Deptuch, Grzegorz W.; Fahim, Farah; Grybos, Pawel; Hoff, Jim; Holm, Scott; Maj, Piotr; Siddons, David Peter; Kmon, Piotr; Trimpl, Marcel; Zimmerman, Tom
Contributors: Fermi Research Alliance, LLC with the U.S. Department of Energy; U.S. Department of Energy, Office of Science,Office of Basic Energy Sciences; Polish National Science Center; 1-BM of the Advanced Photon Source at Argonne National Laboratories operated by the U.S. Department of Energy, Office of Basic Energy Sciences
Source: IEEE Transactions on Circuits and Systems I: Regular Papers ; volume 65, issue 1, page 185-197 ; ISSN 1549-8328 1558-0806
Publisher Information: Institute of Electrical and Electronics Engineers (IEEE)
Publication Year: 2018
Document Type: article in journal/newspaper
Language: unknown
DOI: 10.1109/tcsi.2017.2713767
Availability: https://doi.org/10.1109/tcsi.2017.2713767; http://ieeexplore.ieee.org/ielaam/8919/8248584/7961223-aam.pdf; http://xplorestaging.ieee.org/ielx7/8919/8248584/07961223.pdf?arnumber=7961223
Rights: https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037
Accession Number: edsbas.B33DDD52
Database: BASE