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Sub-10-nm Tunnel Field-Effect Transistor With Graded Si/Ge Heterojunction

Title: Sub-10-nm Tunnel Field-Effect Transistor With Graded Si/Ge Heterojunction
Authors: Chien, ND
Contributors: 科技學院:電機工程學系; Shih, CH (Shih, Chun-Hsing); Chien, ND(Nguyen Dang Chien)
Publisher Information: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
Publication Year: 2011
Collection: National Chi Nan University (NCNU) Repository
Subject Terms: Bandgap engineering; graded Si/Ge heterojunction; short-channel effect; tunnel field-effect transistor (TFET)
Description: This study presents a new sub-10-nm tunnel field-effect transistor ( TFET) with bandgap engineering using a graded Si/Ge heterojunction. Both the height and width of the tunneling barrier are highly controlled by applying gate voltages to ensure a near ideal sub-5-mV/dec switching of scaled sub-10-nm TFETs at 300 K. This study performed a 2-D simulation to elucidate p-body graded Si/Ge heterojunction TFET devices from 50 to 5 nm. The ON-state tunneling barrier around the source was narrowed and lowered to demonstrate a high ON-current; simultaneously, the OFF-state tunneling barrier was raised and extended into the drain to control the short-channel effect and ambipolar leakage current. The shorter the length is, the more abrupt is the switching. The breakthrough in subthreshold swing and short-channel effect make the graded Si/Ge TFET highly promising as an ideal green transistor into sub-10-nm regimes. ; SCI
Document Type: article in journal/newspaper
File Description: 106 bytes; text/html
Language: English
Relation: IEEE ELECTRON DEVICE LETTERS,32(11): 1498-1500 NOV 2011; http://ir.ncnu.edu.tw:8080/handle/310010000/12529; http://ir.ncnu.edu.tw:8080/bitstream/310010000/12529/1/index.html
Availability: http://ir.ncnu.edu.tw:8080/handle/310010000/12529; http://ir.ncnu.edu.tw:8080/bitstream/310010000/12529/1/index.html
Accession Number: edsbas.B36E1BD8
Database: BASE