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Structural, Optical and Electrical Characterizations of Midwave Infrared Ga-Free Type-II InAs/InAsSb Superlattice Barrier Photodetector

Title: Structural, Optical and Electrical Characterizations of Midwave Infrared Ga-Free Type-II InAs/InAsSb Superlattice Barrier Photodetector
Authors: Zavala-Moran, Ulises; Bouschet, Maxime; Perez, Jean-Philippe; Alchaar, Rodolphe; Bernhardt, Sylvie; Ribet-Mohamed, Isabelle; de Anda-Salazar, Francisco; Christol, Philippe
Contributors: Institut d’Electronique et des Systèmes (IES); Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS); Composants à Nanostructure pour le moyen infrarouge (NANOMIR); Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS)-Université de Montpellier (UM)-Centre National de la Recherche Scientifique (CNRS); Universidad Autonoma de San Luis Potosi México (UASLP); LYNRED (Veurey-Voroize); DOTA, ONERA, Université Paris Saclay Palaiseau; ONERA-Université Paris-Saclay; ANR-18-CE24-0019,HOT-MWIR,Photodétecteur et matrice de détecteurs à superréseaux "Ga-free" fonctionnant à haute température dans la totalité de la gamme spectrale du moyen infrarouge(2018)
Source: ISSN: 2304-6732 ; Photonics ; https://hal.science/hal-03042916 ; Photonics, 2020, 7 (3), pp.76. ⟨10.3390/photonics7030076⟩.
Publisher Information: CCSD; MDPI
Publication Year: 2020
Subject Terms: ga-free type-II superlattice; barrier structure; midwave infrared quantum detector; [SPI.TRON]Engineering Sciences [physics]/Electronics; [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics
Description: International audience ; In this paper, a full set of structural, optical and electrical characterizations performed on midwave infrared barrier detectors based on a Ga-free InAs/InAsSb type-II superlattice, grown by molecular beam epitaxy (MBE) on a GaSb substrate, are reported and analyzed. a Minority carrier lifetime value equal to 1 µs at 80 K, carried out on dedicated structure showing photoluminescence peak position at 4.9 µm, is extracted from a time resolved photoluminescence measurement. Dark current density as low as 3.2 × 10−5 A/cm2 at 150 K is reported on the corresponding device exhibiting a 50% cut-off wavelength around 5 µm. A performance analysis through normalized spectral response and dark current density-voltage characteristics was performed to determine both the operating bias and the different dark current regimes.
Document Type: article in journal/newspaper
Language: English
DOI: 10.3390/photonics7030076
Availability: https://hal.science/hal-03042916; https://hal.science/hal-03042916v1/document; https://hal.science/hal-03042916v1/file/photonics-07-00076.pdf; https://doi.org/10.3390/photonics7030076
Rights: http://creativecommons.org/licenses/by/ ; info:eu-repo/semantics/OpenAccess
Accession Number: edsbas.B4DEDA34
Database: BASE