Rutherford backscattering analysis of multilayered CrNi structures to be used for sputtering standards
| Title: | Rutherford backscattering analysis of multilayered CrNi structures to be used for sputtering standards |
|---|---|
| Authors: | Simons, Donald G.; Brown, Matt D.; Fine, Joseph; Andreadis, Tim D.; Navinšek, Boris |
| Source: | Nuclear Instruments and Methods in Physics Research ; volume 218, issue 1-3, page 585-588 ; ISSN 0167-5087 |
| Publisher Information: | Elsevier BV |
| Publication Year: | 1983 |
| Collection: | ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1016/0167-5087(83)91047-5 |
| Availability: | https://doi.org/10.1016/0167-5087(83)91047-5; https://api.elsevier.com/content/article/PII:0167508783910475?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:0167508783910475?httpAccept=text/plain |
| Rights: | https://www.elsevier.com/tdm/userlicense/1.0/ ; https://www.elsevier.com/legal/tdmrep-license |
| Accession Number: | edsbas.BB6F8D0C |
| Database: | BASE |