Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing
| Title: | Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing |
|---|---|
| Authors: | Shintani, M.; Uezono, T.; Hatayama, K.; 益一哉; Kazuya Masu; Sato, T. |
| Publication Year: | 2020 |
| Collection: | T2R2 (Tokyo Tech Research Repository) / 東京工業大学リサーチリポジトリ |
| Document Type: | article in journal/newspaper |
| Language: | English |
| Relation: | oai:t2r2.star.titech.ac.jp:50522481 |
| Availability: | http://t2r2.star.titech.ac.jp/cgi-bin/publicationinfo.cgi?q_publication_content_number=CTT100821498 |
| Accession Number: | edsbas.C2F8A821 |
| Database: | BASE |