Defect analysis of star defects in GaN thin films grown on HVPE GaN substrates
| Title: | Defect analysis of star defects in GaN thin films grown on HVPE GaN substrates |
|---|---|
| Authors: | Ruggles, Tim; Deitz, Julia; Allerman, Andrew; Carter, C. Barry; Michael, Joseph |
| Source: | Microscopy and Microanalysis ; volume 27, issue S1, page 916-917 ; ISSN 1431-9276 1435-8115 |
| Publisher Information: | Oxford University Press (OUP) |
| Publication Year: | 2021 |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1017/s1431927621003512 |
| Availability: | https://doi.org/10.1017/s1431927621003512; https://www.cambridge.org/core/services/aop-cambridge-core/content/view/S1431927621003512 |
| Rights: | https://www.cambridge.org/core/terms |
| Accession Number: | edsbas.C66EEE10 |
| Database: | BASE |