Assessing Radiation Induced Stress Relaxation in Strained Epitaxial Films with HREBSD
| Title: | Assessing Radiation Induced Stress Relaxation in Strained Epitaxial Films with HREBSD |
|---|---|
| Authors: | Ruggles, Tim; Su, Shei; Titze, Michael |
| Source: | Microscopy and Microanalysis ; volume 31, issue Supplement_1 ; ISSN 1431-9276 1435-8115 |
| Publisher Information: | Oxford University Press (OUP) |
| Publication Year: | 2025 |
| Document Type: | article in journal/newspaper |
| Language: | English |
| DOI: | 10.1093/mam/ozaf048.312 |
| Availability: | https://doi.org/10.1093/mam/ozaf048.312; https://academic.oup.com/mam/article-pdf/31/Supplement_1/ozaf048.312/63847638/ozaf048.312.pdf |
| Rights: | https://academic.oup.com/pages/standard-publication-reuse-rights |
| Accession Number: | edsbas.C94FF46A |
| Database: | BASE |