| Title: |
Effect of X-Ray Irradiation on Colloidal Quantum Dot SWIR CMOS Image Sensor |
| Authors: |
Jin, Minhyun; Lee, Sang Yeon; Santos, Pedro; Kang, Jubin; Georgitzikis, Epimitheas; Kim, Joo Hyoung; Genoe, Jan; Kim, Soo Youn; Meynants, Guy; Malinowski, Pawel E.; Lee, Jiwon |
| Source: |
ISSN:0018-9383 ; ISSN:1557-9646 ; Ieee Transactions On Electron Devices, vol. 71 (1), (613-618. |
| Publisher Information: |
Institute of Electrical and Electronics Engineers |
| Publication Year: |
2024 |
| Subject Terms: |
Science & Technology; Technology; Physical Sciences; Engineering; Electrical & Electronic; Physics; Applied; Dark current; Radiation effects; X-ray imaging; Temperature measurement; Current measurement; Wavelength measurement; Silicon; Quantum dot (QD) complementary metal-oxide semiconductor (CMOS) image sensor (QD-CIS); total ionizing dose (TID); X-ray radiation effect; INDUCED DARK CURRENT; RADIATION; 0906 Electrical and Electronic Engineering; Applied Physics; 4009 Electronics; sensors and digital hardware |
| Description: |
sponsorship: This work was supported by the Ministry of Trade, Industry, and Energy (MOTIE) in South Korea, under the Fostering Global Talents for Innovative Growth Program supervised by the Korea Institute for Advancement of Technology (KIAT) under Grant P0017312. (Ministry of Trade, Industry, and Energy (MOTIE) in South Korea|P0017312) ; status: Published |
| Document Type: |
article in journal/newspaper |
| Language: |
English |
| Relation: |
https://lirias.kuleuven.be/handle/20.500.12942/732171; https://doi.org/10.1109/TED.2023.3329452 |
| DOI: |
10.1109/TED.2023.3329452 |
| Availability: |
https://lirias.kuleuven.be/handle/20.500.12942/732171; https://hdl.handle.net/20.500.12942/732171; https://doi.org/10.1109/TED.2023.3329452 |
| Rights: |
info:eu-repo/semantics/restrictedAccess ; intranet |
| Accession Number: |
edsbas.CB4C9419 |
| Database: |
BASE |