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Epitaxial growth of silicon and germanium on (100)-oriented crystalline substrates by RF PECVD at 175 °C

Title: Epitaxial growth of silicon and germanium on (100)-oriented crystalline substrates by RF PECVD at 175 °C
Authors: Mauguin O.; Largeau L.; Patriarche G.; Labrune M.; Bril X.; Roca i Cabarrocas P.
Source: EPJ Photovoltaics, Vol 3, p 30303 (2012)
Publisher Information: EDP Sciences
Publication Year: 2012
Collection: Directory of Open Access Journals: DOAJ Articles
Subject Terms: Renewable energy sources; TJ807-830
Description: We report on the epitaxial growth of crystalline Si and Ge thin films by standard radio frequency plasma enhanced chemical vapor deposition at 175 °C on (100)-oriented silicon substrates. We also demonstrate the epitaxial growth of silicon films on epitaxially grown germanium layers so that multilayer samples sustaining epitaxy could be produced. We used spectroscopic ellipsometry, Raman spectroscopy, transmission electron microscopy and X-ray diffraction to characterize the structure of the films (amorphous, crystalline). These techniques were found to provide consistent results and provided information on the crystallinity and constraints in such lattice-mismatched structures. These results open the way to multiple quantum-well structures, which have been so far limited to few techniques such as Molecular Beam Epitaxy or MetalOrganic Chemical Vapor Deposition.
Document Type: article in journal/newspaper
Language: English
Relation: http://dx.doi.org/10.1051/epjpv/2012010; https://doaj.org/toc/2105-0716; https://doaj.org/article/c7312adf509d4f83bb8363c5dd877f14
DOI: 10.1051/epjpv/2012010
Availability: https://doi.org/10.1051/epjpv/2012010; https://doaj.org/article/c7312adf509d4f83bb8363c5dd877f14
Accession Number: edsbas.CDC13249
Database: BASE