| Title: |
Critical current stability of 2G REBCO tape for space-flight HTS leads |
| Authors: |
Canavan, Edgar R; Comber, Brian |
| Source: |
IOP Conference Series: Materials Science and Engineering ; volume 1302, issue 1, page 012016 ; ISSN 1757-8981 1757-899X |
| Publisher Information: |
IOP Publishing |
| Publication Year: |
2024 |
| Description: |
High reliability is an essential requirement for all spaceflight hardware. Like the Hitomi x-ray observatory, its follow-on mission XRISM uses 2G REBCO tapes as current leads for the superconducting magnets that are a key component of the Adiabatic Demagnetization Refrigerator (ADR) that cools the detector array. While the Hitomi Soft X-ray Spectrometer (SXS) worked flawlessly in orbit, during its development there were indications that the critical current of its specialized REBCO tapes could degrade over time when exposed to normal-humidity air. To demonstrate that the updates to the XRISM HTS lead assemblies had mitigated this risk, a series of tests were carried out to measure the stability of I c of dozens of samples over a period greater than the flight assemblies were exposed to air during integration and test. The test rig allowed not only the measurement of the sample I c , but also the localization of the voltage rise as the current approached I c . We will discuss the trends in the critical current of the samples, as well as localization of lower I c regions. |
| Document Type: |
article in journal/newspaper |
| Language: |
unknown |
| DOI: |
10.1088/1757-899x/1302/1/012016 |
| DOI: |
10.1088/1757-899X/1302/1/012016 |
| DOI: |
10.1088/1757-899X/1302/1/012016/pdf |
| Availability: |
https://doi.org/10.1088/1757-899x/1302/1/012016; https://iopscience.iop.org/article/10.1088/1757-899X/1302/1/012016; https://iopscience.iop.org/article/10.1088/1757-899X/1302/1/012016/pdf |
| Rights: |
https://creativecommons.org/licenses/by/4.0/ ; https://iopscience.iop.org/info/page/text-and-data-mining |
| Accession Number: |
edsbas.D3FF329B |
| Database: |
BASE |