| Title: |
List of contributors |
| Authors: |
Addou, Rafik; Babenko, Vitaliy; Banerjee, Sanjay K.; Chowdhury, Sayema; Chua, Rebekah; Colombo, Luigi; De Padova, Paola; Du, Yi; Geohegan, David B.; Ghorbani-Asl, Mahdi; Hofmann, Stephan; Huang, Yu Li; Jałochowski, Mieczysław; Komsa, Hannu-Pekka; Kozhakhmetov, Azimkhan; Krasheninnikov, Arkady V.; Krawiec, Mariusz; Kretschmer, Silvan; Lin, Yu-Chuan; Liu, Chenze; Lv, Ruitao; McDonnell, Stephen; Olivieri, Bruno; Ottaviani, Carlo; Puretzky, Alex A.; Quaresima, Claudio; Rai, Amritesh; Register, Leonard Frank; Reinke, Petra; Robinson, Joshua A.; Roy, Anupam; Simonson, Nicholas A.; Taneja, Deepyanti; Thye Shen Wee, Andrew; Torsi, Riccardo; Valsaraj, Amithraj; Wan, Yuchi; Wang, Yaguo; Xiao, Kai; Yang, Leping; Yu, Yiling |
| Source: |
Defects in Two-Dimensional Materials ; page ix-x |
| Publisher Information: |
Elsevier |
| Publication Year: |
2022 |
| Collection: |
ScienceDirect (Elsevier - Open Access Articles via Crossref) |
| Document Type: |
book part |
| Language: |
unknown |
| DOI: |
10.1016/b978-0-12-820292-0.00005-7 |
| Availability: |
http://dx.doi.org/10.1016/b978-0-12-820292-0.00005-7; https://api.elsevier.com/content/article/PII:B9780128202920000057?httpAccept=text/xml; https://api.elsevier.com/content/article/PII:B9780128202920000057?httpAccept=text/plain |
| Rights: |
https://www.elsevier.com/tdm/userlicense/1.0/ |
| Accession Number: |
edsbas.D4EB9B8E |
| Database: |
BASE |