Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressing
| Title: | Accelerated reliability testing of highly aligned single-walled carbon nanotube networks subjected to DC electrical stressing |
|---|---|
| Authors: | Strus, Mark C; Chiaramonti, Ann N; Kim, Young Lae; Jung, Yung Joon; Keller, Robert R |
| Source: | Nanotechnology ; volume 22, issue 26, page 265713 ; ISSN 0957-4484 1361-6528 |
| Publisher Information: | IOP Publishing |
| Publication Year: | 2011 |
| Document Type: | article in journal/newspaper |
| Language: | unknown |
| DOI: | 10.1088/0957-4484/22/26/265713 |
| Availability: | https://doi.org/10.1088/0957-4484/22/26/265713; http://stacks.iop.org/0957-4484/22/i=26/a=265713/pdf |
| Accession Number: | edsbas.D6BA14C9 |
| Database: | BASE |