| Title: |
Melting Kinetics of Confined Systems at the Nanoscale: Superheating and Supercooling |
| Authors: |
Sharp, I D; Xu, Q; Yuan, C W; Yi, D O; Liao, C Y; Glaeser, Andreas M; Minor, A M; Beeman, J W; Ridgway, Mark C; Kluth, Patrick; Ager, J W; Chrzan, D C; Haller, E E |
| Source: |
Proceedings of International Conference on the Physics of Semiconductors (ICPS 2006) ; http://link.aip.org/link/?APCPCS/893/191/1 |
| Publisher Information: |
American Institute of Physics (AIP) |
| Publication Year: |
2016 |
| Collection: |
Australian National University: ANU Digital Collections |
| Subject Terms: |
Keywords: Interface energy; Melting; Nanocrystals; Supercooling; Superheating |
| Subject Geographic: |
Vienna Austria |
| Description: |
In situ electron diffraction measurements of silica-embedded Ge nanocrystals reveal a melting/solidification hysteresis of 470 K which is approximately symmetric about the bulk melting point. This surprising behavior, which is thought to be impossible in |
| Document Type: |
conference object |
| Language: |
unknown |
| ISBN: |
978-0-7354-0397-0; 0-7354-0397-X |
| Relation: |
International Conference on the Physics of Semiconductors (ICPS 2006); https://hdl.handle.net/1885/49482 |
| DOI: |
10.1063/1.2729834 |
| Availability: |
https://hdl.handle.net/1885/49482; https://doi.org/10.1063/1.2729834 |
| Accession Number: |
edsbas.E6131609 |
| Database: |
BASE |