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Enhanced Range Migration Algorithm for sub-mm resolution imaging at 120 GHz

Title: Enhanced Range Migration Algorithm for sub-mm resolution imaging at 120 GHz
Authors: Barnabé, Carré; Adrien, Chopard; Guillet, Jean-Paul; Pierre, Gellie
Contributors: Laboratoire de l'intégration, du matériau au système (IMS); Université de Bordeaux (UB)-Institut Polytechnique de Bordeaux-Centre National de la Recherche Scientifique (CNRS); Laboratoire Matériaux et Phénomènes Quantiques (MPQ (UMR_7162)); Centre National de la Recherche Scientifique (CNRS)-Université Paris Cité (UPCité)
Source: 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz); https://hal.science/hal-04745439; 2024 49th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), Sep 2024, Perth, Australia. pp.1-2, ⟨10.1109/IRMMW-THz60956.2024.10697602⟩
Publisher Information: CCSD; IEEE
Publication Year: 2024
Subject Terms: Synthetic Aperture Radar Range Migration Algorithm Frequency Modulated Continuous Wave Non Destructive Testing Si-Ge radar; Synthetic Aperture Radar; Range Migration Algorithm; Frequency Modulated Continuous Wave; Non Destructive Testing; Si-Ge radar; Terahertz; Sensor; [SPI]Engineering Sciences [physics]; [SPI.ELEC]Engineering Sciences [physics]/Electromagnetism; [SPI.OPTI]Engineering Sciences [physics]/Optics / Photonic
Subject Geographic: Perth; Australia
Description: International audience ; A 3D close range Synthetic Aperture Radar system based on the Range Migration Algorithm and working with an affordable and compact Si-Ge Frequency Modulated Continuous Wave radar unit operating at 120 GHz with 19.5 GHz bandwidth is presented. A new method for enhancing lateral resolution combined with a normalization procedure is proposed leading to 0.33 central wavelength resolution. Lateral resolution is compared to a focusing lens system. An object of interest is displayed to reveal Synthetic Aperture Radar advantages in term of lateral resolution and depth of field for Non Destructive Testing and inspection.
Document Type: conference object
Language: English
DOI: 10.1109/IRMMW-THz60956.2024.10697602
Availability: https://hal.science/hal-04745439; https://hal.science/hal-04745439v1/document; https://hal.science/hal-04745439v1/file/IEEE_Conference_Template_IRMMW__Copy_.pdf; https://doi.org/10.1109/IRMMW-THz60956.2024.10697602
Rights: info:eu-repo/semantics/OpenAccess
Accession Number: edsbas.E7117B87
Database: BASE