| Title: |
Evaluating Architectural, Redundancy, and Implementation Strategies for Radiation Hardening of FinFET Integrated Circuits |
| Authors: |
Pagliarini, Samuel; Benites, Luis; Martins, Mayler; Rech, Paolo; Kastensmidt, Fernanda |
| Contributors: |
Defense Advanced Research Projects Agency (DARPA)–Circuit Realization at Faster Timescales; European Commission (EC) through the European Social Fund in the context of the project “ICT Program,”; European Union’s Horizon 2020 Research and Innovation Program through the Marie Sklodowska-Curie |
| Source: |
IEEE Transactions on Nuclear Science ; volume 68, issue 5, page 1045-1053 ; ISSN 0018-9499 1558-1578 |
| Publisher Information: |
Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Year: |
2021 |
| Document Type: |
article in journal/newspaper |
| Language: |
unknown |
| DOI: |
10.1109/tns.2021.3070643 |
| Availability: |
https://doi.org/10.1109/tns.2021.3070643; http://xplorestaging.ieee.org/ielx7/23/9434988/09393957.pdf?arnumber=9393957 |
| Rights: |
https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html ; https://doi.org/10.15223/policy-029 ; https://doi.org/10.15223/policy-037 |
| Accession Number: |
edsbas.F0B35450 |
| Database: |
BASE |