Surface analysis of InP and InGaAs after low temperature diffusion of Zinc
| Title: | Surface analysis of InP and InGaAs after low temperature diffusion of Zinc |
|---|---|
| Authors: | Goff, Florian Le; Mathiot, Daniel; Decobert, Jean; Goec, Jean-Pierre Le; Parillaud, Olivier; Reverchon, Jean-Luc |
| Contributors: | Association Nationale de la Recherche et de la Technologie; Agence Nationale de la Recherche |
| Source: | Semiconductor Science and Technology ; volume 31, issue 9, page 095008 ; ISSN 0268-1242 1361-6641 |
| Publisher Information: | IOP Publishing |
| Publication Year: | 2016 |
| Document Type: | article in journal/newspaper |
| Language: | unknown |
| DOI: | 10.1088/0268-1242/31/9/095008 |
| Availability: | https://doi.org/10.1088/0268-1242/31/9/095008; http://stacks.iop.org/0268-1242/31/i=9/a=095008/pdf; http://stacks.iop.org/0268-1242/31/i=9/a=095008?key=crossref.bbcb8f8cec1bc6baedc43d60d7c91d7f |
| Rights: | http://iopscience.iop.org/info/page/text-and-data-mining ; http://iopscience.iop.org/page/copyright |
| Accession Number: | edsbas.F413CCA9 |
| Database: | BASE |