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Predicting the Bistatic Scattering of a Multi-Port Loaded Structure Under Arbitrary Excitation: The S-Parameters Approach

Title: Predicting the Bistatic Scattering of a Multi-Port Loaded Structure Under Arbitrary Excitation: The S-Parameters Approach
Authors: Kuznetsov, Aleksandr D.; Holopainen, Jari; Viikari, Ville
Contributors: Department of Electronics and Nanoengineering; Ville Viikari Group; Aalto-yliopisto; Aalto University
Publisher Information: IEEE
Publication Year: 2024
Collection: Aalto University Publication Archive (Aaltodoc) / Aalto-yliopiston julkaisuarkistoa
Subject Terms: Antenna measurements; Antennas; Computational modeling; Impedance; Load modeling; Scattering; Scattering parameters; antenna scattering systems; bistatic cross section; mutual coupling; radar cross section (RCS); reconfigurable intelligent surface (RIS); scattering parameters (S-parameters); structural scattering
Description: Publisher Copyright: Authors ; Various applications, including reconfigurable intelligent surfaces (RISs), radio frequency identification, and ambient backscatter devices, are based on scattering. Predicting the scattering properties of these systems accurately and universally in a computationally efficient manner is crucial. In this article, we propose a model for predicting the scattering properties of an electromagnetic structure controlled by loads terminated to multiple ports. This model is based on: 1) S-parameters describing the coupling between the ports; 2) embedded element radiation patterns associated with each port; and 3) structural scattering under multiple incident wave directions. To construct the model, one set of electromagnetic descriptions (e.g., simulations or measurements) needs to be done for a structure before computing the scattering properties of the structure for arbitrary tunable load values. Unlike many other methods, the proposed method fully takes into account structural scattering in different directions simultaneously and requires no simplifications or approximations to the scattering structure, such as the assumption of local periodicity or element identity. This method facilitates characterizing the scattering ability of the structure in terms of bistatic cross section (BCS), also known as bistatic radar cross section (bRCS), and can be beneficial, for instance, in designing RISs and backscatter systems. Simulations and experiments at different frequencies verified the proposed model. ; Peer reviewed
Document Type: article in journal/newspaper
File Description: application/pdf
Language: English
Relation: IEEE Transactions on Antennas and Propagation; Volume 72, issue 8, pp. 6691-6701; https://aaltodoc.aalto.fi/handle/123456789/130888
DOI: 10.1109/TAP.2024.3418517
Availability: https://aaltodoc.aalto.fi/handle/123456789/130888; https://doi.org/10.1109/TAP.2024.3418517
Rights: openAccess
Accession Number: edsbas.F51E79DC
Database: BASE