| Title: |
Refraction effects on x-ray and ultraviolet interferometric probing of laser-produced plasmas |
| Authors: |
Marconi, Mario C., author; Filevich, Jorge, author; Rocca, Jorge J., author; Shlyaptsev, Vyacheslav N., author; Hunter, James R., author; Nilsen, Joseph, author; Dunn, James, author; Smith, Raymond F., author; Optical Society of America, publisher |
| Publisher Information: |
Colorado State University. Libraries |
| Publication Year: |
2007 |
| Collection: |
Digital Collections of Colorado (Colorado State University) |
| Description: |
We present a study detailing the effects of refraction on the analysis and interpretation of line-of-site optical probe characterization techniques within laser-produced plasmas. Results using x-ray laser backlit grid deflectometry and ray-tracing simulations illustrate the extent to which refraction can be a limiting factor in diagnosing high-density, short-scale-length plasmas. Analysis is applied to a recent experiment in which soft x-ray interferometry was used to measure the electron density within a fast-evolving Al plasma. Comparisons are drawn between extreme ultraviolet and ultraviolet probe wavelengths. |
| Document Type: |
text |
| File Description: |
born digital; articles; application/pdf |
| Language: |
English |
| Relation: |
Faculty Publications; Smith, Raymond F., et al., Refraction Effects on X-Ray and Ultraviolet Interferometric Probing of Laser-Produced Plasmas, Journal of the Optical Society of America. B, Optical Physics 20, no. 1 (January 2003): 254-259.; http://hdl.handle.net/10217/67613 |
| Availability: |
http://hdl.handle.net/10217/67613 |
| Rights: |
©2003 Optical Society of America. ; Copyright and other restrictions may apply. User is responsible for compliance with all applicable laws. For information about copyright law, please see https://libguides.colostate.edu/copyright. |
| Accession Number: |
edsbas.FD909FC2 |
| Database: |
BASE |