Structural Test Coverage Criteria for Deep Neural Networks
| Title: | Structural Test Coverage Criteria for Deep Neural Networks |
|---|---|
| Authors: | Sun, Youcheng; Huang, Xiaowei; Kroening, Daniel; Sharp, James; Hill, Matthew; Ashmore, Rob |
| Source: | ACM Transactions on Embedded Computing Systems (TECS) - Special Issue ESWEEK 2019, CASES 2019, CODES+ISSS 2019 and EMSOFT 2019. 18(5s):1-23 |
| Availability: | http://dl.acm.org/doi/10.1145/3358233 |
| Database: | ACM Full-Text Collection |