An Empirical Study on Concurrency Bugs in Interrupt-Driven Embedded Software
| Title: | An Empirical Study on Concurrency Bugs in Interrupt-Driven Embedded Software |
|---|---|
| Authors: | Li, Chao; Chen, Rui; Wang, Boxiang; Wang, Zhixuan; Yu, Tingting; Jiang, Yunsong; Gu, Bin; Yang, Mengfei |
| Source: | Proceedings of the 32nd ACM SIGSOFT International Symposium on Software Testing and Analysis. :1345-1356 |
| Availability: | http://dl.acm.org/doi/10.1145/3597926.3598140 |
| Database: | ACM Full-Text Collection |