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Simultaneous resistance switching and rectifying effects in a single hybrid perovskite

Title: Simultaneous resistance switching and rectifying effects in a single hybrid perovskite
Authors: Xuefen Song; Junran Zhang; Yuchi Qian; Zhongjing Xia; Jinlian Chen; Hao Yin; Jing Liu; Linbo Feng; Tianyu Liu; Zihong Zhu; Yuyang Hua; You Liu; Jiaxiao Yuan; Feixiang Ge; Dawei Zhou; Mubai Li; Yang Hang; Fangfang Wang; Tianshi Qin; Lin Wang
Source: InfoMat, Vol 6, Iss 9, Pp n/a-n/a (2024)
Publisher Information: Wiley, 2024.
Publication Year: 2024
Collection: LCC:Materials of engineering and construction. Mechanics of materials; LCC:Information technology
Subject Terms: halide perovskite; low power; low SET voltage; memristor; self‐rectifying; Materials of engineering and construction. Mechanics of materials; TA401-492; Information technology; T58.5-58.64
Description: Abstract Halide perovskites with naturally coupled electron‐ion dynamics hold great potential for nonvolatile memory applications. Self‐rectifying memristors are promising as they can avoid sneak currents and simplify device configuration. Here we report a self‐rectifying memristor firstly achieved in a single perovskite (NHCINH3)3PbI5 (abbreviated as (IFA)3PbI5), which is sandwiched by Ag and ITO electrodes as the simplest cell in a crossbar array device configuration. The iodide ions of (IFA)3PbI5 can be easily activated, of which the migration in the bulk contributes to the resistance hysteresis and the reaction with Ag at the interface contributes to the spontaneous formation of AgI. The perfect combination of n‐type AgI and p‐type (IFA)3PbI5 gives rise to the rectification function like a p–n diode. Such a self‐rectifying memristor exhibits the record‐low set power consumption and voltage. This work emphasizes that the multifunction of ions in perovskites can simplify the fabrication procedure, decrease the programming power, and increase the integration density of future memory devices.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 2567-3165
Relation: https://doaj.org/toc/2567-3165
DOI: 10.1002/inf2.12562
Access URL: https://doaj.org/article/a7d03e3928244d129ed8c2fa2da49c8b
Accession Number: edsdoj.7d03e3928244d129ed8c2fa2da49c8b
Database: Directory of Open Access Journals